Volume
4, Issue
1, Pages
92-94,
January 2014
Variation in Hall Coefficient with E-M Field of ZnTe Thin Film prepared by vacuum evaporation
Dr. Vaibhav Jain
Deptt. of Physics, D.A.V.(P.G.) College, Bulandshahr, UP, India.
Thin film of ZnTe was prepared by vacuum evaporation method. The variation in Hall coefficient RH of prepared thin film was recorded with electromagnetic field of different frequencies (2-20 MHz at 2 MHz, steps) and of 5mV, and l0mV amplitudes. The statistical analysis of obtained data was done by R-software which showed that the value of Hall coefficient decreases significantly with increment in frequency of E-M field.
Keywords: Vacuum evaporation method, Hall coefficient, R-software.
