2231–4202  (Print)                
2249–9970  (Online)             
Peer Reviewed and Refereed Journal

JPAST is a Peer Reviewed & Refereed biannual multidisciplinary journal starting from July 2011. Articles are invited for Dec 23 issue.
Volume 4, Issue 1, Pages 92-94, January 2014

Variation in Hall Coefficient with E-M Field of ZnTe Thin Film prepared by vacuum evaporation

Dr. Vaibhav Jain

Deptt. of Physics, D.A.V.(P.G.) College, Bulandshahr, UP, India.


Thin film of ZnTe was prepared by vacuum evaporation method. The variation in Hall coefficient RH of prepared thin film was recorded with electromagnetic field of different frequencies (2-20 MHz at 2 MHz, steps) and of 5mV, and l0mV amplitudes. The statistical analysis of obtained data was done by R-software which showed that the value of Hall coefficient decreases significantly with increment in frequency of E-M field.

Keywords: Vacuum evaporation method, Hall coefficient, R-software.

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