2231–4202  (Print)                
2249–9970  (Online)             
Peer Reviewed and Refereed Journal

JPAST is a Peer Reviewed & Refereed biannual multidisciplinary journal starting from July 2011. Articles are invited for Dec 23 issue.
Volume 1, Issue 2, Pages 1-3, July 2011

Effect Of E-M Field On Hall Coefficient Of ZnTe Thin Film


Vaibhav Jain*, Ruchi Agrawal#, Abhijit Kulshrestha* and  A. K. Sharma#

*Deptt. of Physics, Jodhpur National University, Jodhpur, Rajasthan, 324001

#Deptt. of Physics, D.A.V.(P.G.) College, Bulandshahr, UP, 203001


Thin film of ZnTe was prepared by vacuum evoparation method. The variation in Hall coefficient RH of prepared thin film was recorded with electromagnetic field of different frequencies (5-15 MHz with 1MHz steps) with 10mV and 15mV amplitudes. The statistical analysis of obtained data was done by R-software which showed that the value of Hall coefficient decreases significantly with increment in frequency of E-M field.

Keywords: Vacuum evaporation method, Hall coefficient, R-software.

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