ISSN
2231–4202  (Print)                
2249–9970  (Online)             


JPAST is biannual multidisciplinary journal starting from July 2011. Articles are invited for July 20 issue.
Effect of E-M Field on Hall Coefficient of CdS Thin Film – Vaibhav Jain, Ruchi Agrawal, Dr. A. K. Sharma, Dr. Pawan Kumar and Dr. Abhijit Kulshreshtha

Effect of E-M Field on Hall Coefficient of CdS Thin Film

Vaibhav Jain1,*, Ruchi Agrawal2, Dr. A. K. Sharma3, Dr. Pawan Kumar4 and Dr. Abhijit Kulshreshtha5

1,*Research Scholar, Deptt. of Physics, Faculty of Engg. & Tech., Jodhpur National University, Jodhpur, Rajasthan

2Research Scholar, Deptt. of Physics, JJTU, Jhunjunu, Rajasthan, India

3Deptt. of Physics, D.A.V. (P.G.) College, Bulandshahr, India

4Deptt. of Physics, Agarsen Degree College, Sikandarabad, Bulandshahr, India

5Deptt. of Physics, Faculty of Engg. & Tech., Jodhpur National University, Jodhpur, Rajasthan

 

Thin film of CdS was prepared by vacuum evoparation method. The variation in Hall coefficient RH of prepared thin film was recorded with electromagnetic field of different frequencies (5-15 MHz at 1MHz steps) and of 10mV, and 15mV amplitudes. The statistical analysis of obtained data was done by R-software which showed that the value of Hall coefficient decreases significantly with increment in frequency of E-M field.

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