ISSN
2231–4202  (Print)                
2249–9970  (Online)             


JPAST is biannual multidisciplinary journal starting from July 2011. Articles are invited for July 20 issue.
A Flexible Reliability Growth Model for various Releases of Software under the Influence of Testing Resources – Jagvinder Singh, Ompal Singh*, Deepti Aggrawal, Adarsh Anand and Indarpal Singh

A Flexible Reliability Growth

Model for various Releases of

Software under the Influence of

Testing Resources

Jagvinder Singh1, Ompal Singh2,*, Deepti Aggrawal3, Adarsh Anand4 and Indarpal Singh5

1Maharaja Agrasen College, University of Delhi, India

2,3,4Department of Operational Research, University of Delhi, Delhi, India

5DNPG College, Gulaothi, Bulandshahar, UP, India

 

The life of software is very short in the environment of perfect competition market. Therefore the software developers have to come up with multiple releases in order to survive in the market. But, enhancing the product and coming up with multiple releases puts a constant pressure on even the best organized engineering organizations. The reason being, up-grading a software application is a complex process. Up-grades of software introduce the risk that the new release will contain a bug, causing the program to fail. Therefore, to capture the effect of faults generated in the software with multiple release, we have developed a multi release software reliability model in this paper. The model uniquely take into account the faults of the current release and the remaining faults of just previous release. The multi release software reliability growth model treats the faults removal rate as a function of testing resources consumed. In addition, most of the debugging process in real life is not perfect. Due to complexity and incomplete understanding of the software, the testing team may not be able to remove/correct the fault perfectly on observation/ detection of a failure and the original fault may remain resulting in the phenomenon known as imperfect debugging, or get replaced by another fault causing error generation. The effects of both type of imperfect debugging during testing phase are incorporated in our proposed multi-release model. The model developed is validated on real data set with software which has been released in the market with new features four times

Keywords: Flexible Reliability Growth Models, Various releases, Testing resources.

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